Divya K.S.

Work place: Department of CSE, Sri Krishna College of Technology, Coimbatore, India

E-mail: divyaks.1990@gmail.com


Research Interests: Applied computer science, Computational Science and Engineering, Computer systems and computational processes, Computer Architecture and Organization, Theoretical Computer Science, Data Structures and Algorithms


Ms. Divya K.S. was born in Ernakulam, India in 1990. She received Bachelor of Technology degree in Computer Science and Engineering under Cochin University, in 2012. She is currently pursuing Master of Engineering degree in Computer Science and Engineering under Anna University, Chennai, India.

Author Articles
Similar Words Identification Using Naive and TF-IDF Method

By Divya K.S. R. Subha S. Palaniswami

DOI: https://doi.org/10.5815/ijitcs.2014.11.06, Pub. Date: 8 Oct. 2014

Requirement satisfaction is one of the most important factors to success of software. All the requirements that are specified by the customer should be satisfied in every phase of the development of the software. Satisfaction assessment is the determination of whether each component of the requirement has been addressed in the design document. The objective of this paper is to implement two methods to identify the satisfied requirements in the design document. To identify the satisfied requirements, similar words in both of the documents are determined. The methods such as Naive satisfaction assessment and TF-IDF satisfaction assessment are performed to determine the similar words that are present in the requirements document and design documents. The two methods are evaluated on the basis of the precision and recall value. To perform the stemming, the Porter’s stemming algorithm is used. The satisfaction assessment methods would determine the similarity in the requirement and design documents. The final result would give a accurate picture of the requirement satisfaction so that the defects can be determined at the early stage of software development. Since the defects determines at the early stage, the cost would be low to correct the defects.

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